Seminario e Live demo “Advances in surface electrical characterization at the nanoscale by using Scanning Kelvin probe microscopy (SKPM) Atomic Force Microscopy (AFM)”

Partecipa all’ evento satellite di Park System durante il Nanoinnovation 2019 dal titolo “Advances in surface electrical characterization at the nanoscale by using Scanning Kelvin probe microscopy (SKPM) Atomic Force Microscopy (AFM) Seminar and Live Demo”