Vi invitiamo a partecipare al Workshop “Advanced SPM for Material Investigation”, che organizzeremo insieme all’ Università Federico II di Napoli, CNR SPIN e Park System AFM, durante la giornata del 19 di Giugno 2019.

Luogo dell’evento: Università Federico II di Napoli sede di Ingegneria della Scuola Politecnica e delle Scienze di Base (Aula Bobbio) in P. le Tecchio.
Potete aderire inviando una e-mail alla Sig.ra Stefania Fabbri stefania.fabbri@gambetti.it, oppure telefonandoci al numero 02 90093082.

Programma:
Time Item   Description/ Title
09:30 Registration
10:00 Welcome & Introduction Local Host Università di Napoli Federico II Dip. Di Fisica e C.N.R. SPIN
Introduction by Prof. Antonio Cassinese
10:15 Scientific Talk I Scanning Kelvin Probe microscopy on organic thin film transistors
Dr. Fabio Chiarella, SPIN-CNR Naples
10:35 Scientific Talk II Scanning Probe Microscopy and Spectroscopy on Oxides
Dr. Marco Salluzzo, CNR-SPIN
10:55 Scientific Talk III Scanning near field optical microscopy and spectroscopy on two dimensional materials
Dr. Felice Gesuele Dept. Of Physics University of Naples
11:05 Scientific Talk IV Piezoelectric Characterization of AlN thin films by Piezoresponse Force Microscopy
Dr.ssa Tiziana Stomeo, Center for Bio-Molecular Nanotechnology – Istituto Italiano
di Tecnologia (IIT)
11:35 Coffee break
12.00 Featured talk Enhanced Surface Potential Detection using Frequency Modulation SKPM
Dr. Andrea Cerreta, Park Systems Europe
12:20 Scientific Talk V Morphological characterization of LAO/STO micro-membranes
Prof. Roberto di Capua University of Naples Federico II
12:40 Scientific Talk VI Nanoscale characterization of visco-hyperelastic cell membranes with atomic force
spectroscopy microscopy)
Prof. Luciano Lamberti, Politecnico of Bari
13:00 Scientific Talk VII Elasto-mechanical study of MoS2 domes by Atomic Force Microscopy and Spectroscopy
Prof. Fabrizio Bobba University of Salerno
13:20 Lunch
14.20 AFM Instrumentation Demo Park Systems NX10 AFM
15:20 Round Table Discussion Most advanced research trends